Gwenaël Gaborit, Pierre Jarrige, Frédéric Lecoche, Jean Dahdah, Eric Duraz, Christophe Volat, Senior Member, IEEE, and Lionel Duvillaret


In this paper we illustrate the ability of electro-optic sensors to perform electric (E)-field vectorial measurements. Thanks to their frequency response spreading over nine decades and to their measurement dynamics reaching 120 dB, these sensors are of high interest for some applications (near field mapping, energy line monitoring, electromagnetic compatibility, and so on). Furthermore, due to their fully dielectric structure and millimetric size, almost no perturbation is induced on the E-field to be measured, even in the near field region. This paper is focused on high-intensity pulsed E-field characterization in different environments such as air, water (bioelectromagnetism applications), or plasmas (in situ assessment of the E-field associated to an electric discharge and to the induced plasma). The use of such a technology for electrical equipment and energy line monitoring is also investigated.


Within the available sensors dedicated to electric (E)-field characterization [1], the use of antennas constitutes the most widespread technique. While antennas are convenient and provide good sensitivities at high frequency, they induce too strong perturbations to be used for near field characterization. In addition, their bandwidth is limited to a few decades only. As an alternative to the metallic antennas, electrooptic (EO) techniques can be exploited and the EO sensors have been actually developed for more than three decades [2]–[4]. Taking benefit of optical fiber and optoelectronics advances, competitive EO probes allowing low invasiveness and vectorial measurement of the E-field have emerged since the end of the last century [5]–[9]. Millimeter-size pigtailed EO transducers are fully dielectric and allow to perform measurements of the E-field vector from dc to several gigahertz and even up to terahertz frequencies using time-equivalent sampling techniques. Furthermore, a simultaneous measurement of two components of the E-field vector within a single EO probe is possible [10], [11]…



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