Kapteos will participate at the next JNM 2019 (Journées Nationales Micro-Ondes) which takes place at the congress center of Caen (France) located near the city center from the Wednesday 15th of May until the Friday 17th of May 2019. This 21st edition of the National Microwave Days is organized by CRISMAT, GREYC and ESIGELEC-IRSEEM.

This conference brings together nearly 600 university and industry researchers recognized for their scientific qualities, working in very broad fields, ranging from materials, antennas, components and radio frequency and microwave circuits, to communication systems and radars.

The three-day event will be the subject of oral joint French sessions and posters. For the 2019 edition of the JNM, special attention will be given to the 5th generation communications and the Internet of Things on a thematic day on 14th of May.

Kapteos will present a technical paper: Sonde électro-optique fibrée : l’outil idéal pour la caractérisation vectorielle de champs électriques associés à la 5G ? (Electro-optic probe: the ideal tool to characterize the vector electric fields associated to 5G?)

Kapteos will present its main products line and accessories. A real-life demonstration will be available on our booth. We will also present new features and accessories like:

  • Our totally new software that operate our optoelectronic converter which integrates major visual changes and features
  • Our new probe design to continue the ramp-up in frequency measurement even under high RF energy
  • Our new accessory to calibrate our probe either inside water-based liquids or air with an accuracy much better than ±0.8 dB
  • And of course our expertise for measuring E-field in harsh environment